The following publications are possibly variants of this publication:
- SCR-based ESD protection in nanometer SOI technologiesOlivier Marichal, Geert Wybo, Benjamin Van Camp, Pieter Vanysacker, Bart Keppens. mr, 47(7):1060-1068, 2007. [doi]
- ESD protection circuit design for ultra-sensitive IO applications in advanced sub-90nm CMOS technologiesMarkus P. J. Mergens, Geert Wybo, Bart Keppens, Benjamin Van Camp, Frederic De Ranter, Koen G. Verhaege, John Armer, Phillip Jozwiak, Christian C. Russ. iscas 2005: 1194-1197 [doi]
- ESD issues in advanced CMOS bulk and FinFET technologies: Processing, protection devices and circuit strategiesChristian Russ. mr, 48(8-9):1403-1411, 2008. [doi]