CMOS Checkers with Testable Bridging and Transistor Stuck-on Faults - researchr publication authors

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Cecilia Metra, Michele Favalli, Piero Olivo, Bruno Riccò. CMOS Checkers with Testable Bridging and Transistor Stuck-on Faults. In Proceedings IEEE International Test Conference 1992, Discover the New World of Test and Design, Baltimore, Maryland, USA, September 20-24, 1992. pages 948-957, IEEE Computer Society, 1992.

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