Cecilia Metra, Michele Favalli, Piero Olivo, Bruno Riccò. CMOS Checkers with Testable Bridging and Transistor Stuck-on Faults. In Proceedings IEEE International Test Conference 1992, Discover the New World of Test and Design, Baltimore, Maryland, USA, September 20-24, 1992. pages 948-957, IEEE Computer Society, 1992.
@inproceedings{MetraFOR92,
title = {CMOS Checkers with Testable Bridging and Transistor Stuck-on Faults},
author = {Cecilia Metra and Michele Favalli and Piero Olivo and Bruno Riccò},
year = {1992},
tags = {testing},
researchr = {https://researchr.org/publication/MetraFOR92},
cites = {0},
citedby = {0},
pages = {948-957},
booktitle = {Proceedings IEEE International Test Conference 1992, Discover the New World of Test and Design, Baltimore, Maryland, USA, September 20-24, 1992},
publisher = {IEEE Computer Society},
isbn = {0-7803-0760-7},
}