Cecilia Metra, Michele Favalli, Piero Olivo, Bruno Riccò. CMOS Checkers with Testable Bridging and Transistor Stuck-on Faults. In Proceedings IEEE International Test Conference 1992, Discover the New World of Test and Design, Baltimore, Maryland, USA, September 20-24, 1992. pages 948-957, IEEE Computer Society, 1992.
Abstract is missing.