Highly Testable and Compact 1-out-of-n CMOS Checkers - researchr publication authors

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Cecilia Metra, Michele Favalli, Bruno Riccò. Highly Testable and Compact 1-out-of-n CMOS Checkers. In The IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems, October 17-19, 1994, Montréal, Quebec, Canada, Proceedings. pages 142-150, IEEE Computer Society, 1994.

This author has not been identified. Look up 'Cecilia Metra' in GoogleThis author has not been identified. Look up 'Michele Favalli' in GoogleThis author has not been identified. Look up 'Bruno Riccò' in Google

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