Cecilia Metra, Michele Favalli, Bruno Riccò. Highly Testable and Compact 1-out-of-n CMOS Checkers. In The IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems, October 17-19, 1994, Montréal, Quebec, Canada, Proceedings. pages 142-150, IEEE Computer Society, 1994.
@inproceedings{MetraFR94a,
title = {Highly Testable and Compact 1-out-of-n CMOS Checkers},
author = {Cecilia Metra and Michele Favalli and Bruno Riccò},
year = {1994},
tags = {testing},
researchr = {https://researchr.org/publication/MetraFR94a},
cites = {0},
citedby = {0},
pages = {142-150},
booktitle = {The IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems, October 17-19, 1994, Montréal, Quebec, Canada, Proceedings},
publisher = {IEEE Computer Society},
isbn = {0-8186-6307-3},
}