Highly Testable and Compact 1-out-of-n CMOS Checkers - researchr publication

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Cecilia Metra, Michele Favalli, Bruno Riccò. Highly Testable and Compact 1-out-of-n CMOS Checkers. In The IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems, October 17-19, 1994, Montréal, Quebec, Canada, Proceedings. pages 142-150, IEEE Computer Society, 1994.

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