Research on deep RIE-based through-Si-via micromachining for 3-D system-in-package integration

Min Miao, Yufeng Jin, Hongguang Liao, Liwei Zhao, Yunhui Zhu, Xin Sun, Yunxia Guo. Research on deep RIE-based through-Si-via micromachining for 3-D system-in-package integration. In 4th IEEE International Conference on Nano/Micro Engineered and Molecular Systems, IEEE-NEMS 2009, Shenzhen, China, January 5-8, 2009. pages 90-93, IEEE, 2009. [doi]

Authors

Min Miao

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Yufeng Jin

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Hongguang Liao

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Liwei Zhao

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Yunhui Zhu

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Xin Sun

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Yunxia Guo

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