Spencer K. Millican, Kewal K. Saluja. A Test Partitioning Technique for Scheduling Tests for Thermally Constrained 3D Integrated Circuits. In 2014 27th International Conference on VLSI Design and 2014 13th International Conference on Embedded Systems, Mumbai, India, January 5-9, 2014. pages 20-25, IEEE, 2014. [doi]
@inproceedings{MillicanS14,
title = {A Test Partitioning Technique for Scheduling Tests for Thermally Constrained 3D Integrated Circuits},
author = {Spencer K. Millican and Kewal K. Saluja},
year = {2014},
doi = {10.1109/VLSID.2014.11},
url = {http://dx.doi.org/10.1109/VLSID.2014.11},
researchr = {https://researchr.org/publication/MillicanS14},
cites = {0},
citedby = {0},
pages = {20-25},
booktitle = {2014 27th International Conference on VLSI Design and 2014 13th International Conference on Embedded Systems, Mumbai, India, January 5-9, 2014},
publisher = {IEEE},
}