Spencer K. Millican, Kewal K. Saluja. A Test Partitioning Technique for Scheduling Tests for Thermally Constrained 3D Integrated Circuits. In 2014 27th International Conference on VLSI Design and 2014 13th International Conference on Embedded Systems, Mumbai, India, January 5-9, 2014. pages 20-25, IEEE, 2014. [doi]
No references recorded for this publication.
No citations of this publication recorded.