ByungJun Min, Kang-Woon Lee, Han-Ju Lee, So-Ra Kim, Seung-Gyu Oh, Byung-gil Jeon, Hee-Hyun Yang, Min-Kyu Kim, Sung Hee Cho, Honsik Cheong, Chilhee Chung, Kinam Kim. An embedded nonvolatile FRAM with electrical fuse repair scheme and one time programming scheme for high performance smart cards. In Proceedings of the IEEE 2005 Custom Integrated Circuits Conference, CICC 2005, DoubleTree Hotel, San Jose, California, USA, September 18-21, 2005. pages 255-258, IEEE, 2005. [doi]
@inproceedings{MinLLKOJYKCCCK05,
title = {An embedded nonvolatile FRAM with electrical fuse repair scheme and one time programming scheme for high performance smart cards},
author = {ByungJun Min and Kang-Woon Lee and Han-Ju Lee and So-Ra Kim and Seung-Gyu Oh and Byung-gil Jeon and Hee-Hyun Yang and Min-Kyu Kim and Sung Hee Cho and Honsik Cheong and Chilhee Chung and Kinam Kim},
year = {2005},
doi = {10.1109/CICC.2005.1568655},
url = {http://dx.doi.org/10.1109/CICC.2005.1568655},
researchr = {https://researchr.org/publication/MinLLKOJYKCCCK05},
cites = {0},
citedby = {0},
pages = {255-258},
booktitle = {Proceedings of the IEEE 2005 Custom Integrated Circuits Conference, CICC 2005, DoubleTree Hotel, San Jose, California, USA, September 18-21, 2005},
publisher = {IEEE},
isbn = {0-7803-9023-7},
}