ByungJun Min, Kang-Woon Lee, Han-Ju Lee, So-Ra Kim, Seung-Gyu Oh, Byung-gil Jeon, Hee-Hyun Yang, Min-Kyu Kim, Sung Hee Cho, Honsik Cheong, Chilhee Chung, Kinam Kim. An embedded nonvolatile FRAM with electrical fuse repair scheme and one time programming scheme for high performance smart cards. In Proceedings of the IEEE 2005 Custom Integrated Circuits Conference, CICC 2005, DoubleTree Hotel, San Jose, California, USA, September 18-21, 2005. pages 255-258, IEEE, 2005. [doi]
Abstract is missing.