Xin-ming, Zhi-Wen Zhang, Ziwei Fan, Yao Qin, Yuan-yuan Liu, Bo Zhang 0027. High Reliability GaN FET Gate Drivers for Next-generation Power Electronics Technology. In 13th IEEE International Conference on ASIC, ASICON 2019, Chongqing, China, October 29 - November 1, 2019. pages 1-4, IEEE, 2019. [doi]
Abstract is missing.