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Effects of the electrical stress on the conduction characteristics of metal gate/MgO/InP stacks

E. Miranda, J. Martin-Martinez, E. O Connor, G. Hughes, P. Casey, K. Cherkaoui, S. Monaghan, R. Long, D. O Connell, P. K. Hurley. Effects of the electrical stress on the conduction characteristics of metal gate/MgO/InP stacks. Microelectronics Reliability, 49(9-11):1052-1055, 2009. [doi]

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E. Miranda

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J. Martin-Martinez

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E. O Connor

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G. Hughes

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P. Casey

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K. Cherkaoui

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S. Monaghan

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R. Long

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D. O Connell

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P. K. Hurley

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