Effects of the electrical stress on the conduction characteristics of metal gate/MgO/InP stacks

E. Miranda, J. Martin-Martinez, E. O Connor, G. Hughes, P. Casey, K. Cherkaoui, S. Monaghan, R. Long, D. O Connell, P. K. Hurley. Effects of the electrical stress on the conduction characteristics of metal gate/MgO/InP stacks. Microelectronics Reliability, 49(9-11):1052-1055, 2009. [doi]

Abstract

Abstract is missing.