Variability aware modeling for yield enhancement of SRAM and logic - researchr publication related

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Miguel Miranda, Paul Zuber, Petr Dobrovolný, Philippe Roussel. Variability aware modeling for yield enhancement of SRAM and logic. In Design, Automation and Test in Europe, DATE 2011, Grenoble, France, March 14-18, 2011. pages 1153-1158, IEEE, 2011. [doi]

The following publications are possibly variants of this publication:

Variability aware modeling of SoCs: From device variations to manufactured system yieldMiguel Miranda, B. Dierickx, P. Zuber, P. Dobrovoln, F. Kutscherauer, P. Roussel, P. Poliakov. isqed 2009: 547-553 [doi]

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