Differential analysis of Round-Reduced AES faulty ciphertexts

Amir-Pasha Mirbaha, Jean-Max Dutertre, Assia Tria. Differential analysis of Round-Reduced AES faulty ciphertexts. In 2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2013, New York City, NY, USA, October 2-4, 2013. pages 204-211, IEEE, 2013. [doi]

Authors

Amir-Pasha Mirbaha

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Jean-Max Dutertre

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Assia Tria

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