Amir-Pasha Mirbaha, Jean-Max Dutertre, Assia Tria. Differential analysis of Round-Reduced AES faulty ciphertexts. In 2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2013, New York City, NY, USA, October 2-4, 2013. pages 204-211, IEEE, 2013. [doi]
@inproceedings{MirbahaDT13,
title = {Differential analysis of Round-Reduced AES faulty ciphertexts},
author = {Amir-Pasha Mirbaha and Jean-Max Dutertre and Assia Tria},
year = {2013},
doi = {10.1109/DFT.2013.6653607},
url = {http://dx.doi.org/10.1109/DFT.2013.6653607},
researchr = {https://researchr.org/publication/MirbahaDT13},
cites = {0},
citedby = {0},
pages = {204-211},
booktitle = {2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2013, New York City, NY, USA, October 2-4, 2013},
publisher = {IEEE},
}