Amir-Pasha Mirbaha, Jean-Max Dutertre, Assia Tria. Differential analysis of Round-Reduced AES faulty ciphertexts. In 2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2013, New York City, NY, USA, October 2-4, 2013. pages 204-211, IEEE, 2013. [doi]
Abstract is missing.