A Study of Capture-Safe Test Generation Flow for At-Speed Testing - researchr publication authors

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Kohei Miyase, Xiaoqing Wen, Seiji Kajihara, Yuta Yamato, Atsushi Takashima, Hiroshi Furukawa, Kenji Noda, Hideaki Ito, Kazumi Hatayama, Takashi Aikyo, Kewal K. Saluja. A Study of Capture-Safe Test Generation Flow for At-Speed Testing. IEICE Transactions, 93-A(7):1309-1318, 2010. [doi]

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