Kohei Miyase, Xiaoqing Wen, Seiji Kajihara, Yuta Yamato, Atsushi Takashima, Hiroshi Furukawa, Kenji Noda, Hideaki Ito, Kazumi Hatayama, Takashi Aikyo, Kewal K. Saluja. A Study of Capture-Safe Test Generation Flow for At-Speed Testing. IEICE Transactions, 93-A(7):1309-1318, 2010. [doi]
@article{MiyaseWKYTFNIHAS10,
title = {A Study of Capture-Safe Test Generation Flow for At-Speed Testing},
author = {Kohei Miyase and Xiaoqing Wen and Seiji Kajihara and Yuta Yamato and Atsushi Takashima and Hiroshi Furukawa and Kenji Noda and Hideaki Ito and Kazumi Hatayama and Takashi Aikyo and Kewal K. Saluja},
year = {2010},
url = {http://search.ieice.org/bin/summary.php?id=e93-a_7_1309},
tags = {testing, data-flow},
researchr = {https://researchr.org/publication/MiyaseWKYTFNIHAS10},
cites = {0},
citedby = {0},
journal = {IEICE Transactions},
volume = {93-A},
number = {7},
pages = {1309-1318},
}