Kohei Miyase, Xiaoqing Wen, Seiji Kajihara, Yuta Yamato, Atsushi Takashima, Hiroshi Furukawa, Kenji Noda, Hideaki Ito, Kazumi Hatayama, Takashi Aikyo, Kewal K. Saluja. A Study of Capture-Safe Test Generation Flow for At-Speed Testing. IEICE Transactions, 93-A(7):1309-1318, 2010. [doi]
No references recorded for this publication.
No citations of this publication recorded.