Stress Test for Disturb Faults in Non-Volatile Memories

Mohammad Gh. Mohammad, Kewal K. Saluja. Stress Test for Disturb Faults in Non-Volatile Memories. In 12th Asian Test Symposium (ATS 2003), 17-19 November 2003, Xian, China. pages 384-389, IEEE Computer Society, 2003. [doi]

Authors

Mohammad Gh. Mohammad

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Kewal K. Saluja

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