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Mohammad Gh. Mohammad, Kewal K. Saluja. Stress Test for Disturb Faults in Non-Volatile Memories. In 12th Asian Test Symposium (ATS 2003), 17-19 November 2003, Xian, China. pages 384-389, IEEE Computer Society, 2003. [doi]
Possibly Related PublicationsThe following publications are possibly variants of this publication: Electrical Model For Program Disturb Faults in Non-Volatile MemoriesMohammad Gh. Mohammad, Kewal K. Saluja. vlsid 2003: 217-222 [doi] Fault collapsing for flash memory disturb faultsMohammad Gh. Mohammad, Laila Terkawi. ets 2005: 142-147 [doi] Optimizing program disturb fault tests using defect-based testingMohammad Gh. Mohammad, Kewal K. Saluja. tcad, 24(6):905-915, 2005. [doi]
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