Stress Test for Disturb Faults in Non-Volatile Memories

Mohammad Gh. Mohammad, Kewal K. Saluja. Stress Test for Disturb Faults in Non-Volatile Memories. In 12th Asian Test Symposium (ATS 2003), 17-19 November 2003, Xian, China. pages 384-389, IEEE Computer Society, 2003. [doi]

Abstract

Abstract is missing.