M. Monishmurali, Nagothu Karmel Kranthi, Gianluca Boselli, Mayank Shrivastava. Impact of Thin-oxide Gate on the On-Resistance of HV-PNP Under ESD Stress. In IEEE International Reliability Physics Symposium, IRPS 2023, Monterey, CA, USA, March 26-30, 2023. pages 1-5, IEEE, 2023. [doi]
Abstract is missing.