Thomas Moon, Nicholas Tzou, Xian Wang, Hyun Woo Choi, Abhijit Chatterjee. Low-cost high-speed pseudo-random bit sequence characterization using nonuniform periodic sampling in the presence of noise. In 30th IEEE VLSI Test Symposium, VTS 2012, Maui, Hawaii, USA, 23-26 April 2012. pages 146-151, IEEE, 2012. [doi]
@inproceedings{MoonTWCC12,
title = {Low-cost high-speed pseudo-random bit sequence characterization using nonuniform periodic sampling in the presence of noise},
author = {Thomas Moon and Nicholas Tzou and Xian Wang and Hyun Woo Choi and Abhijit Chatterjee},
year = {2012},
doi = {10.1109/VTS.2012.6231094},
url = {http://dx.doi.org/10.1109/VTS.2012.6231094},
researchr = {https://researchr.org/publication/MoonTWCC12},
cites = {0},
citedby = {0},
pages = {146-151},
booktitle = {30th IEEE VLSI Test Symposium, VTS 2012, Maui, Hawaii, USA, 23-26 April 2012},
publisher = {IEEE},
isbn = {978-1-4673-1074-1},
}