Hyun Woo Choi - researchr alias

researchr

You are not signed in
Sign in
Sign up

Viewing Publication 1 - 22 from 22

2019

Efficient Built-In Test and Calibration of High Speed Serial I/O Systems Using Monobit Signal AcquisitionThomas Moon, Hyun Woo Choi, David C. Keezer, Abhijit Chatterjee. et, 35(6):809-822, 2019. [doi]

2016

Concurrent Multi-Channel Crosstalk Jitter Characterization Using Coprime Period Channel StimulusNicholas Tzou, Debesh Bhatta, Xian Wang, Te-Hui Chen, Sen-Wen Hsiao, Barry J. Muldrey, Hyun Woo Choi, Abhijit Chatterjee. tcas, 63-I(6):859-870, 2016. [doi]

2015

2014

Timing Noise Characterization of High-Speed Digital Bit Sequences Using Incoherent Subsampling and Algorithmic Clock RecoveryHyun Woo Choi, Thomas Moon, Abhijit Chatterjee. tim, 63(12):2733-2749, 2014. [doi]

Multi-channel testing architecture for high-speed eye-diagram using pin electronics and subsampling monobit reconstruction algorithmsThomas Moon, Hyun Woo Choi, David C. Keezer, Abhijit Chatterjee. vts 2014: 1-6 [doi]

2013

2012

Spectral Estimation Based Acquisition of Incoherently Under-sampled Periodic Signals: Application to Bandwidth InterleavingDebesh Bhatta, Nicholas Tzou, Hyun Woo Choi, Abhijit Chatterjee. ats 2012: 196-201 [doi]

Multi-gigahertz arbitrary timing generator and data pattern serializer/formatterDavid C. Keezer, Te-Hui Chen, Carl Edward Gray, Hyun Woo Choi, Sungyeol Kim, Seongkwan Lee, Hosun Yoo. itc 2012: 1-11 [doi]

Low cost high-speed test data acquisition: Accurate period estimation driven signal reconstruction using incoherent subsamplingThomas Moon, Hyun Woo Choi, Abhijit Chatterjee. itc 2012: 1-9 [doi]

Low-cost high-speed pseudo-random bit sequence characterization using nonuniform periodic sampling in the presence of noiseThomas Moon, Nicholas Tzou, Xian Wang, Hyun Woo Choi, Abhijit Chatterjee. vts 2012: 146-151 [doi]

Low Cost EVM Testing of Wireless RF SoC Front-Ends Using MultitonesVishwanath Natarajan, Hyun Woo Choi, Aritra Banerjee, Shreyas Sen, Abhijit Chatterjee, Ganesh Srinivasan, Friedrich Taenzler, Soumendu Bhattacharya. tcad, 31(7):1088-1101, 2012. [doi]

BIST/Digital-Compatible Testing of RF Devices Using Distortion Model FittingShreyas Sen, Aritra Banerjee, Vishwanath Natarajan, Shyam Kumar Devarakond, Hyun Woo Choi, Abhijit Chatterjee. et, 28(4):405-419, 2012. [doi]

Low-cost wideband periodic signal reconstruction using incoherent undersampling and back-end cost optimizationNicholas Tzou, Debesh Bhatta, Sen-Wen Hsiao, Hyun Woo Choi, Abhijit Chatterjee. itc 2012: 1-10 [doi]

Dual-frequency incoherent subsampling driven test response acquisition of spectrally sparse wideband signals with enhanced time resolutionNicholas Tzou, Thomas Moon, Xian Wang, Hyun Woo Choi, Abhijit Chatterjee. vts 2012: 140-145 [doi]

Higher than Nyquist test waveform synthesis and digital phase noise injection using time-interleaved mixed-mode data convertersXian Wang, Hyun Woo Choi, Thomas Moon, Nicholas Tzou, Abhijit Chatterjee. itc 2012: 1-10 [doi]

2009

Iterative built-in testing and tuning of mixed-signal/RF systemsAbhijit Chatterjee, Donghoon Han, Vishwanath Natarajan, Shyam Kumar Devarakond, Shreyas Sen, Hyun Woo Choi, Rajarajan Senguttuvan, Soumendu Bhattacharya, Abhilash Goyal, Deuk Lee, Madhavan Swaminathan. iccd 2009: 319-326 [doi]

2008

EVM Testing of Wireless OFDM Transceivers Using Intelligent Back-End Digital Signal Processing AlgorithmsVishwanath Natarajan, Hyun Woo Choi, Deuk Lee, Rajarajan Senguttuvan, Abhijit Chatterjee. itc 2008: 1-10 [doi]

Sign in or sign up to see more results.

runs on WebDSL