Abhijit Chatterjee, Donghoon Han, Vishwanath Natarajan, Shyam Kumar Devarakond, Shreyas Sen, Hyun Woo Choi, Rajarajan Senguttuvan, Soumendu Bhattacharya, Abhilash Goyal, Deuk Lee, Madhavan Swaminathan. Iterative built-in testing and tuning of mixed-signal/RF systems. In 27th International Conference on Computer Design, ICCD 2009, Lake Tahoe, CA, USA, October 4-7, 2009. pages 319-326, IEEE, 2009. [doi]
Abstract is missing.