Iterative built-in testing and tuning of mixed-signal/RF systems

Abhijit Chatterjee, Donghoon Han, Vishwanath Natarajan, Shyam Kumar Devarakond, Shreyas Sen, Hyun Woo Choi, Rajarajan Senguttuvan, Soumendu Bhattacharya, Abhilash Goyal, Deuk Lee, Madhavan Swaminathan. Iterative built-in testing and tuning of mixed-signal/RF systems. In 27th International Conference on Computer Design, ICCD 2009, Lake Tahoe, CA, USA, October 4-7, 2009. pages 319-326, IEEE, 2009. [doi]

Authors

Abhijit Chatterjee

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Donghoon Han

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Vishwanath Natarajan

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Shyam Kumar Devarakond

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Shreyas Sen

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Hyun Woo Choi

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Rajarajan Senguttuvan

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Soumendu Bhattacharya

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Abhilash Goyal

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Deuk Lee

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Madhavan Swaminathan

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