Iterative built-in testing and tuning of mixed-signal/RF systems

Abhijit Chatterjee, Donghoon Han, Vishwanath Natarajan, Shyam Kumar Devarakond, Shreyas Sen, Hyun Woo Choi, Rajarajan Senguttuvan, Soumendu Bhattacharya, Abhilash Goyal, Deuk Lee, Madhavan Swaminathan. Iterative built-in testing and tuning of mixed-signal/RF systems. In 27th International Conference on Computer Design, ICCD 2009, Lake Tahoe, CA, USA, October 4-7, 2009. pages 319-326, IEEE, 2009. [doi]

@inproceedings{ChatterjeeHNDSCSBGLS09,
  title = {Iterative built-in testing and tuning of mixed-signal/RF systems},
  author = {Abhijit Chatterjee and Donghoon Han and Vishwanath Natarajan and Shyam Kumar Devarakond and Shreyas Sen and Hyun Woo Choi and Rajarajan Senguttuvan and Soumendu Bhattacharya and Abhilash Goyal and Deuk Lee and Madhavan Swaminathan},
  year = {2009},
  doi = {10.1109/ICCD.2009.5413136},
  url = {http://dx.doi.org/10.1109/ICCD.2009.5413136},
  researchr = {https://researchr.org/publication/ChatterjeeHNDSCSBGLS09},
  cites = {0},
  citedby = {0},
  pages = {319-326},
  booktitle = {27th International Conference on Computer Design, ICCD 2009, Lake Tahoe, CA, USA, October 4-7, 2009},
  publisher = {IEEE},
  isbn = {978-1-4244-5029-9},
}