Shreyas Sen, Aritra Banerjee, Vishwanath Natarajan, Shyam Kumar Devarakond, Hyun Woo Choi, Abhijit Chatterjee. BIST/Digital-Compatible Testing of RF Devices Using Distortion Model Fitting. J. Electronic Testing, 28(4):405-419, 2012. [doi]
Abstract is missing.