Low Cost EVM Testing of Wireless RF SoC Front-Ends Using Multitones

Vishwanath Natarajan, Hyun Woo Choi, Aritra Banerjee, Shreyas Sen, Abhijit Chatterjee, Ganesh Srinivasan, Friedrich Taenzler, Soumendu Bhattacharya. Low Cost EVM Testing of Wireless RF SoC Front-Ends Using Multitones. IEEE Trans. on CAD of Integrated Circuits and Systems, 31(7):1088-1101, 2012. [doi]

Abstract

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