Low Cost EVM Testing of Wireless RF SoC Front-Ends Using Multitones

Vishwanath Natarajan, Hyun Woo Choi, Aritra Banerjee, Shreyas Sen, Abhijit Chatterjee, Ganesh Srinivasan, Friedrich Taenzler, Soumendu Bhattacharya. Low Cost EVM Testing of Wireless RF SoC Front-Ends Using Multitones. IEEE Trans. on CAD of Integrated Circuits and Systems, 31(7):1088-1101, 2012. [doi]

Authors

Vishwanath Natarajan

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Hyun Woo Choi

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Aritra Banerjee

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Shreyas Sen

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Abhijit Chatterjee

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Ganesh Srinivasan

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Friedrich Taenzler

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Soumendu Bhattacharya

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