Low Cost EVM Testing of Wireless RF SoC Front-Ends Using Multitones

Vishwanath Natarajan, Hyun Woo Choi, Aritra Banerjee, Shreyas Sen, Abhijit Chatterjee, Ganesh Srinivasan, Friedrich Taenzler, Soumendu Bhattacharya. Low Cost EVM Testing of Wireless RF SoC Front-Ends Using Multitones. IEEE Trans. on CAD of Integrated Circuits and Systems, 31(7):1088-1101, 2012. [doi]

@article{NatarajanCBSCSTB12,
  title = {Low Cost EVM Testing of Wireless RF SoC Front-Ends Using Multitones},
  author = {Vishwanath Natarajan and Hyun Woo Choi and Aritra Banerjee and Shreyas Sen and Abhijit Chatterjee and Ganesh Srinivasan and Friedrich Taenzler and Soumendu Bhattacharya},
  year = {2012},
  doi = {10.1109/TCAD.2012.2187652},
  url = {http://dx.doi.org/10.1109/TCAD.2012.2187652},
  researchr = {https://researchr.org/publication/NatarajanCBSCSTB12},
  cites = {0},
  citedby = {0},
  journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
  volume = {31},
  number = {7},
  pages = {1088-1101},
}