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Jesus Moreno, Víctor H. Champac, Michel Renovell. Low voltage testing for interconnect opens under process variations. In 13th Latin American Test Workshop, LATW 2012, Quito, Ecuador, April 10-13, 2012. pages 1-6, IEEE Computer Society, 2012. [doi]
Possibly Related PublicationsThe following publications are possibly variants of this publication: Effectiveness of Low-Voltage Testing to Detect Interconnect Open Defects Under Process VariationsJesus Moreno, Michel Renovell, Víctor H. Champac. tvlsi, 24(1):378-382, 2016. [doi]
The following publications are possibly variants of this publication: