A 0.3-V Operating, ::::V::::::th::-Variation-Tolerant SRAM under DVS Environment for Memory-Rich SoC in 90-nm Technology Era and Beyond

Yasuhiro Morita, Hidehiro Fujiwara, Hiroki Noguchi, Kentaro Kawakami, Junichi Miyakoshi, Shinji Mikami, Koji Nii, Hiroshi Kawaguchi, Masahiko Yoshimoto. A 0.3-V Operating, ::::V::::::th::-Variation-Tolerant SRAM under DVS Environment for Memory-Rich SoC in 90-nm Technology Era and Beyond. IEICE Transactions, 89-A(12):3634-3641, 2006. [doi]

Abstract

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