Yoshikazu Morooka, Shigeru Mori, Hiroshi Miyamoto, Michihiro Yamada. An Address Maskable Parallel Testing for Ultra High Density DRAMs. In Proceedings IEEE International Test Conference 1991, Test: Faster, Better, Sooner, Nashville, TN, USA, October 26-30, 1991. pages 556-563, IEEE Computer Society, 1991.
Abstract is missing.