Despina C. Moschou, M. A. Exarchos, Dimitrios N. Kouvatsos, G. J. Papaioannou, A. Arapoyanni, Apostolos T. Voutsas. Reliability and defectivity comparison of n- and p-channel SLS ELA polysilicon TFTs fabricated with a novel crystallization technique. Microelectronics Reliability, 48(8-9):1544-1548, 2008. [doi]
@article{MoschouEKPAV08,
title = {Reliability and defectivity comparison of n- and p-channel SLS ELA polysilicon TFTs fabricated with a novel crystallization technique},
author = {Despina C. Moschou and M. A. Exarchos and Dimitrios N. Kouvatsos and G. J. Papaioannou and A. Arapoyanni and Apostolos T. Voutsas},
year = {2008},
doi = {10.1016/j.microrel.2008.06.006},
url = {http://dx.doi.org/10.1016/j.microrel.2008.06.006},
tags = {C++, reliability},
researchr = {https://researchr.org/publication/MoschouEKPAV08},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {48},
number = {8-9},
pages = {1544-1548},
}