On-Die Noise Measurement During Automatic Test Equipment (ATE) Testing and In-System-Test (IST) - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

Seyed Nima Mozaffari, Bonita Bhaskaran, Shantanu Sarangi, Suhas Satheesh, Kuo-Lin Fu, Nithin Valentine, P. Manikandan, Mahmut Yilmaz. On-Die Noise Measurement During Automatic Test Equipment (ATE) Testing and In-System-Test (IST). In 40th IEEE VLSI Test Symposium, VTS 2022, San Diego, CA, USA, April 25-27, 2022. pages 1-6, IEEE, 2022. [doi]

This author has not been identified. Look up 'Seyed Nima Mozaffari' in GoogleThis author has not been identified. Look up 'Bonita Bhaskaran' in GoogleThis author has not been identified. Look up 'Shantanu Sarangi' in GoogleThis author has not been identified. Look up 'Suhas Satheesh' in GoogleThis author has not been identified. Look up 'Kuo-Lin Fu' in GoogleThis author has not been identified. Look up 'Nithin Valentine' in GoogleThis author has not been identified. Look up 'P. Manikandan' in GoogleThis author has not been identified. Look up 'Mahmut Yilmaz' in Google

runs on WebDSL