Seyed Nima Mozaffari, Bonita Bhaskaran, Shantanu Sarangi, Suhas Satheesh, Kuo-Lin Fu, Nithin Valentine, P. Manikandan, Mahmut Yilmaz. On-Die Noise Measurement During Automatic Test Equipment (ATE) Testing and In-System-Test (IST). In 40th IEEE VLSI Test Symposium, VTS 2022, San Diego, CA, USA, April 25-27, 2022. pages 1-6, IEEE, 2022. [doi]
@inproceedings{MozaffariBSSFVM22,
title = {On-Die Noise Measurement During Automatic Test Equipment (ATE) Testing and In-System-Test (IST)},
author = {Seyed Nima Mozaffari and Bonita Bhaskaran and Shantanu Sarangi and Suhas Satheesh and Kuo-Lin Fu and Nithin Valentine and P. Manikandan and Mahmut Yilmaz},
year = {2022},
doi = {10.1109/VTS52500.2021.9794251},
url = {https://doi.org/10.1109/VTS52500.2021.9794251},
researchr = {https://researchr.org/publication/MozaffariBSSFVM22},
cites = {0},
citedby = {0},
pages = {1-6},
booktitle = {40th IEEE VLSI Test Symposium, VTS 2022, San Diego, CA, USA, April 25-27, 2022},
publisher = {IEEE},
isbn = {978-1-6654-1060-1},
}