Seyed Nima Mozaffari, Bonita Bhaskaran, Shantanu Sarangi, Suhas Satheesh, Kuo-Lin Fu, Nithin Valentine, P. Manikandan, Mahmut Yilmaz. On-Die Noise Measurement During Automatic Test Equipment (ATE) Testing and In-System-Test (IST). In 40th IEEE VLSI Test Symposium, VTS 2022, San Diego, CA, USA, April 25-27, 2022. pages 1-6, IEEE, 2022. [doi]
Abstract is missing.