More Efficient Testing of Metal-Oxide Memristor-Based Memory

Seyed Nima Mozaffari, Spyros Tragoudas, Themistoklis Haniotakis. More Efficient Testing of Metal-Oxide Memristor-Based Memory. IEEE Trans. on CAD of Integrated Circuits and Systems, 36(6):1018-1029, 2017. [doi]

Authors

Seyed Nima Mozaffari

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Spyros Tragoudas

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Themistoklis Haniotakis

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