More Efficient Testing of Metal-Oxide Memristor-Based Memory

Seyed Nima Mozaffari, Spyros Tragoudas, Themistoklis Haniotakis. More Efficient Testing of Metal-Oxide Memristor-Based Memory. IEEE Trans. on CAD of Integrated Circuits and Systems, 36(6):1018-1029, 2017. [doi]

Abstract

Abstract is missing.