Seyed Nima Mozaffari, Spyros Tragoudas, Themistoklis Haniotakis. More Efficient Testing of Metal-Oxide Memristor-Based Memory. IEEE Trans. on CAD of Integrated Circuits and Systems, 36(6):1018-1029, 2017. [doi]
@article{MozaffariTH17-0,
title = {More Efficient Testing of Metal-Oxide Memristor-Based Memory},
author = {Seyed Nima Mozaffari and Spyros Tragoudas and Themistoklis Haniotakis},
year = {2017},
doi = {10.1109/TCAD.2016.2608863},
url = {https://doi.org/10.1109/TCAD.2016.2608863},
researchr = {https://researchr.org/publication/MozaffariTH17-0},
cites = {0},
citedby = {0},
journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
volume = {36},
number = {6},
pages = {1018-1029},
}