Memories in Scaled Technologies: A Review of Process Induced Failures, Test Methodologies, and Fault Tolerance - researchr publication authors

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Saibal Mukhopadhyay, Qikai Chen, Kaushik Roy. Memories in Scaled Technologies: A Review of Process Induced Failures, Test Methodologies, and Fault Tolerance. In Patrick Girard, Andrzej Krasniewski, Elena Gramatová, Adam Pawlak, Tomasz Garbolino, editors, Proceedings of the 10th IEEE Workshop on Design & Diagnostics of Electronic Circuits & Systems (DDECS 2007), Kraków, Poland, April 11-13, 2007. pages 69-74, IEEE Computer Society, 2007.

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