Failure analysis of GaAs microwave devices with plastic encapsulation by electro-optical techniques - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

W. Ben Naceur, N. Malbert, Nathalie Labat, Hélène Frémont, D. Carisetti, J. C. Clement, J. L. Muraro, B. Bonnet. Failure analysis of GaAs microwave devices with plastic encapsulation by electro-optical techniques. Microelectronics Reliability, 53(9-11):1375-1380, 2013. [doi]

This author has not been identified. Look up 'W. Ben Naceur' in GoogleThis author has not been identified. Look up 'N. Malbert' in GoogleThis author has not been identified. Look up 'Nathalie Labat' in GoogleThis author has not been identified. Look up 'Hélène Frémont' in GoogleThis author has not been identified. Look up 'D. Carisetti' in GoogleThis author has not been identified. Look up 'J. C. Clement' in GoogleThis author has not been identified. Look up 'J. L. Muraro' in GoogleThis author has not been identified. Look up 'B. Bonnet' in Google

runs on WebDSL