W. Ben Naceur, N. Malbert, Nathalie Labat, Hélène Frémont, D. Carisetti, J. C. Clement, J. L. Muraro, B. Bonnet. Failure analysis of GaAs microwave devices with plastic encapsulation by electro-optical techniques. Microelectronics Reliability, 53(9-11):1375-1380, 2013. [doi]