Failure analysis of GaAs microwave devices with plastic encapsulation by electro-optical techniques

W. Ben Naceur, N. Malbert, Nathalie Labat, Hélène Frémont, D. Carisetti, J. C. Clement, J. L. Muraro, B. Bonnet. Failure analysis of GaAs microwave devices with plastic encapsulation by electro-optical techniques. Microelectronics Reliability, 53(9-11):1375-1380, 2013. [doi]

Abstract

Abstract is missing.