Benoit Nadeau-Dostie, Jean-Francois Cote, Harry Hulvershorn, Stephen Pateras. An embedded technique for at-speed interconnect testing. In Proceedings IEEE International Test Conference 1999, Atlantic City, NJ, USA, 27-30 September 1999. pages 431-438, IEEE Computer Society, 1999.
@inproceedings{Nadeau-DostieCHP99,
title = {An embedded technique for at-speed interconnect testing},
author = {Benoit Nadeau-Dostie and Jean-Francois Cote and Harry Hulvershorn and Stephen Pateras},
year = {1999},
tags = {testing},
researchr = {https://researchr.org/publication/Nadeau-DostieCHP99},
cites = {0},
citedby = {0},
pages = {431-438},
booktitle = {Proceedings IEEE International Test Conference 1999, Atlantic City, NJ, USA, 27-30 September 1999},
publisher = {IEEE Computer Society},
}